HOLBROOK, N.Y., 20 April 2007. Matrix Metrologies Inc. in Holbrook, N.Y., is offering an XRF X-ray Film thickness measurement tool.
The System HMX handheld XRF X-ray film thickness and composition analysis tool enables the user to take the lab to the process.
The HMX is an X-ray fluorescence solution for measurement of large samples. It provides at-process XRF measurement for QC, plating line, and analysis lab applications and at-sample analysis in the factory or in the field along with alloy sorting and alloy identification for substrate materials management.
In addition the HMX's "batch measurement" mode enables users to calculate the average thickness of a batch of small parts with one X ray measurement.
For more information contact Matrix Metrologies online at www.matrixmetrologies.com.
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