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Ethernet data acquisition system for military and industrial uses introduced by UEI

Posted by John Keller

WALPOLE, Mass., 3 July 2013. United Electronic Industries Inc. (UEI) is introducing the CF-4-eG FLATRACK Ethernet-based data acquisition (DAQ) and control system for applications in rugged military and industrial environments.

The rack-mountable 1U chassis offers high-density I/O capabilities, measures 6 by 1.75 by 17.5 inches, and features user-friendly programmability, company officials say.

The DNF-4-eG FLATRACK provides two Gigabit Ethernet (100/10 Base-T compatible) interfaces and four front-loading I/O slots. More than 50 compatible I/O boards can be installed and interchanged for blended I/O architectures.

The FLATRACK can accommodate as many as 100 analog inputs, 128 analog outputs, 192 digital I/O bits, 48 ARINC-429 channels, a four MIL-STD-1553 serial bus, and 32 RS-232/422/485 ports. Users can design, configure, test and blend I/O channels.

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The DNF-4-eG FLATRACK features a universal API-friendly layer and compatibility with common programming languages, including VB, VB .NET, C, C#, C++, J#. The system is compatible with popular OS distributions, including Windows, Linux, RTX, InTime, VxWorks and QNX, as well as engineering packages such as MATLAB, LabVIEW, DASYLab, OPC, and ActiveX.

The FLATRACK is the host to dual-channel NICs, a PowerPC CPU, two USB 2.0 controller/slave ports, timing/trigger interface circuitry, configuration ports, power supply, and operational software.

The FLATRACK delivers 130,000 hour MTBF, vibration tested to 3 g, and shock tested to 50 g. It is optimized for rugged industrial and military environments and temperatures ranging from -40 to 70 degrees Celsius.

Consuming less than eight Watts per chassis (not including I/O), AC and DC powered versions of the FLATRACK require either a universal 9 to 36 volt DC power source or 100 to 240 volts AC of amplitude with operating frequencies ranging from 50 to 60 Hz.

For more information contact UEI online at www.ueidaq.com.


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