SANTA ROSA, Calif., 27 April 2016. Keysight Technologies Inc. in Santa Rosa, Calif., is introducing CX3300 series device current test and measurementwaveform analyzer for researchers struggling with high-speed transient current measurements during advanced device characterization and engineers working to reduce power/current consumption in low-power devices.
The analyzer enables a minimum of 100 picoamperes (pA) level dynamic current measurements with a maximum of 200 MHz bandwidth, 1-gigasamples-per-second sampling rate, and 14- or 16-bit wide dynamic range.
Keysight's CX3300 analyzer enabling the simultaneous measurement of wideband and low-level current waveforms. By providing a 14-bit or 16-bit wide dynamic measurement range, one instrument can meet a wide range of measurement requirements without using several instruments.
A graphical user interface on a WXGA 14.1-inch multi-touch display, and advanced measurement and analysis software, make previously difficult low-level current waveform measurements and analyses efficient and easy to make, company officials say.
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Using the CX3300 analyzer, researchers can measure transient current even if the pulse width is narrower than 100 nanoseconds. This capability is particularly beneficial for device engineers developing semiconductor or advanced memory devices, since it enables them to visualize previously unmeasurable waveforms.
Users can capture current consumption waveforms at any moment, whether the device is in its sleep/standby or active state. The ability to see how a device consumes power enables engineers to evaluate and reduce a device's power and current consumption.
Engineers also can use the CX3300 analyzer as a research debugging tool, and write more aggressive power consumption specifications. For more information contact Keysight online at www.keysight.com/find/cx3300.
