One high-resolution profiler for the disk industry is the MP2200 from Chapman Instruments, designed to be used as both a disk-production tool for production-floor in-line quality inspection and a research and development tool for establishing standards. While the `2200 uses the same noncontact measurement technology as the company`s earlier profilers, it features a shorter, 543-nm wavelength light source. This green laser lets the profiler make high-resolution measurements with up to 100-× magnification objectives, with a 50-nm sampling interval. The profiler operator can make complete circumferential scans in less than 30 seconds.