Practical Guide to Maximizing DC Measurement Performance

Taking quality DC measurements is a cornerstone of testing semiconductor chips. Learn how you can improve measurement accuracy and product quality for power management ICs, RF power amplifiers, and other ICs by implementing these foundational best practices. This guide includes the following topics:

  • Source measure unit theory of operation
  • Measurement accuracy
  • Accuracy versus speed trade-off
  • The effects of pulsing
  • Using remote sense to offset the effects of lead resistance
  • Compensating for offset voltage
  • Minimizing external noise
  • Guarding against leakage current
  • Understanding the importance of calibration

This white paper sponsored by National Instruments.

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