Spectrum analyzer for hunting down sources of RF interference in the field introduced by Tektronix

BEAVERTON, Ore., 21 Sept. 2012. Tektronix Inc. in Beaverton, Ore., is introducing the SPECMON spectrum analyzer for hunting down sources of RF interference in the field.

The SPECMON test & measurementt instrument can discover and capture events as short as 3.7 microseconds using swept DPX technology, advanced triggering, wide capture bandwidth and three domain signal analysis.

With the trend toward wireless everywhere, interference issues have emerged as a major concern, Tektronix officials say. Many are critical safety issues such as interference to the airport radar and emergency communication channels. At the same time, interfering signals have become harder to detect due to the pervasive use of elusive hopping wideband signals.

At the core of SPECMON is its swept DPX technology that automatically scans the frequency range in real time to find transient interferers. With density and frequency mask triggers, SPECMON can capture infrequent transients and save events of interest. It offers real-time bandwidth as wide as 110 MHz.

The spectrum analyzer also has mapping, interferer locator, signal demodulation, and automated field measurements. Common field test parameters and measurement include pulse, field strength, signal strength, EMI test, channel power, ACPR, OBW, and spur search.

Support for multi-domain signal analysis helps pinpoint the root cause of problems in several domains. Using the integrated 10.4-inch touch-screen display, SPECMON users can analyze captured data in the time, frequency and modulation domains at any time with correlated markers.

The open data format gives engineers the flexibility to analyze captured data with third-party software-analysis tools such as MATLAB or export mapping results into Google Earth or MapInfo.

For more information contact Tektronix online at www.tektronix.com.

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