Six PXI test and measurement modules with reconfigurable FPGA-based I/O introduced by National Instruments
AUSTIN, Texas, 1 June 2011. National Instruments Corp. in Austin, Texas, is introducing six adapter PXI test and measurement modules with reconfigurable I/O based on field-programmable gate arrays (FPGAs) for general-purpose automated test and high-speed digital communications. The National Instruments FlexRIO family with the company's LabVIEW FPGA technology with high-speed, I/O. The modules offer four general-purpose digitizers, a module for high-speed digital I/O, and a fast Analog Devices 16-bit analog-to-digital converter.
The six available modules are the 5762 16-bit, 250 megasample-per-second digitizer with AD9467 A/D converter from Analog Devices; the 6587 16-channel, 1 gigabit-per-second digital I/O module for high-speed LVDS interfaces; the 5731 12-bit, 40 megasample-per-second general-purpose digitizer adapter module; the 5732 14-bit, 80 megasample-per-second general-purpose digitizer adapter module; the 5733 16-bit, 120 megasample-per-second high-resolution digitizer adapter module; and the 5734 16-bit, 120 megasample-per-second, quad-channel, high-resolution digitizer adapter module.
For more information contact National Instruments online at www.ni.com/flexrio.