IAR releases new in-circuit debugging probe
UPPSALA, Sweden, 27 Sept. 2012. IAR Systems, a provider of tools for software designers, has announced that the I-jet, a new high-performing in-circuit debugging probe, is now available for sale and delivery.
UPPSALA, Sweden, 27 Sept. 2012. IAR Systems, a provider of tools for software designers, has announced that the I-jet, a new high-performing in-circuit debugging probe, is now available for sale and delivery. With advanced features and high performance, I-jet provides new possibilities for fast and stable debugging. It is also integrated into the C/C++ compiler and debugger tool suite IAR Embedded Workbench for ARM.
I-jet provides a debugging platform with download speeds of up to 1 MB per second, JTAG and Serial Wire Debug (SWD) clocking at up to 32 MHz, and Serial Wire Output (SWO) frequencies of up to 60 MHz. I-jet is also capable of delivering power to the target board and accurately measuring target power consumption. It is fully plug-and-play, and offers user-friendly features such as automatic core recognition and direct download into the flash memory of many popular microcontrollers. The I-jet is powered by USB.
The new debug probe supports microcontrollers based on ARM7, ARM9, ARM11, ARM Cortex-M, ARM Cortex-R4, and ARM Cortex-A5/A8/A9 cores. The Serial Wire Viewer (SWV) is supported using the UART and Manchester encoding modes. Embedded Trace Buffer (ETB) and JTAG adaptive clocking are supported and all JTAG signals can be monitored.
This is the first product launch in IAR Systems’ investment in an extended technology platform for advanced and efficient debugging in the embedded industry. This launch will be followed by others in a new product portfolio of in-circuit debugging probes, targeted for simplified, seamless and more flexible development workflows. The entire portfolio will be delivered with access to IAR Systems’ global support and product maintenance.
For more information on the I-jet, visit IAR Systems here.