Agilent Technologies introduces in-circuit tester with digital capabilities

SANTA CLARA, Calif., 18 April 2009. Agilent Technologies Inc. has launched the Medalist i1000D in-circuit test system with digital test capabilities. The i1000D bridges a solution gap between high-functionality in-circuit testers and low-end manufacturing defects analyzers, reveals a representative.

Apr 18th, 2009

SANTA CLARA, Calif., 18 April 2009. Agilent Technologies Inc. has launched the Medalist i1000D in-circuit test system with digital test capabilities. The i1000D bridges a solution gap betweenhigh-functionality in-circuit testers and low-end manufacturing defects analyzers, reveals a representative.

The Medalist i1000D is, according to a representative, designed for cost-sensitive manufacturers looking for a solution with both analog and digital capabilities to tackle more complex printed circuit board assemblies (PCBAs).

The i1000D offers full native boundary scan test capabilities and Agilent's latest VTEP v2.0 powered vectorless test suite with Cover-Extend Technology.

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