Marvin introduces kit to help extend life cycles of legacy semiconductor test sets

IRVINE, Calif. – Marvin Test Solutions Inc. in Irvine, Calif., is introducing the Marvin Test Expansion Kit (MTEK) semiconductor test and measurement subsystem aimed at extending the life cycles of legacy semiconductor test sets.

Jul 5th, 2017
By Mil & Aero staff
By Mil & Aero staff

IRVINE, Calif. – Marvin Test Solutions Inc. in Irvine, Calif., is introducing the Marvin Test Expansion Kit (MTEK) semiconductor test and measurement subsystem aimed at extending the life cycles of legacy semiconductor test sets.

The MTEK subsystem adds test capabilities to legacy semiconductor test systems that lack the ability to meet the test requirements of current devices.

Based on Marvin's portfolio of PXI and PXI Express chassis and instrumentation as well as selections from other suppliers, MTEK enables customers to configure a subsystem with exactly the resources needed to deliver the capabilities lacking in their current legacy ATE.

MTEK is an open-architecture plug-and-play solution that adds RF, high-performance digital, and high-performance analog capabilities. MTEK is compatible with legacy semiconductor testers, including Teradyne, LTX/Credence, Eagle, ASL100, Sentry, and Verigy.

Related: Marvin Test Solutions adds PXI Express capabilities to the company's TS-900 semiconductor test set

Expandable in the field, MTEK is designed to support both engineering and production environments.

"Our customers were looking for a solution that would allow them to extend the life of their existing test systems without the associated capital investment of complete replacement," says Stephen Sargeant, CEO of Marvin Test Solutions. "MTEK provides an upgrade path with the additional test capabilities they need as their requirements change."

For more information contact Marvin Test Solutions online at www.marvintest.com.

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