Electro-optical shortwave infrared (SWIR) camera for machine vision uses introduced by Teledyne DALSA

June 18, 2020
The Linea SWIR camera features an indium gallium arsenide (InGaAs) in a compact package suitable for uses like solar and silicon wafer inspection.

WATERLOO, Ontario – Teledyne DALSA in Waterloo, Ontario, is introducing the Linea SWIR line scan camera for machine vision applications.

The Linea SWIR camera features an indium gallium arsenide (InGaAs) in a compact package suitable for applications like solar and silicon wafer inspection, mineral sorting, food and packaged good inspection, and recycling.

Linea SWIR camera is a 1k resolution camera with responsive 12.5-micron pixels, 40 kHz line rate, cycling mode, programmable I/Os, power over Ethernet (PoE), and precision time protocol (PTP).

"The shortwave infrared (SWIR) camera will help users greatly improve the quality of their output," says Mike Grodzki, product manager for the Linea SWIR. "With the ability to differentiate materials and detect moisture, Linea SWIR will allow users to more easily identify foreign contaminants in their product stream."

For more information contact Teledyne DALSA online at www.teledynedalsa.com.

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