Summary points:
- Optical-grade sapphire wafers designed to withstand extreme conditions in navigation sensors, avionics, and space applications.
- Proprietary process ensures extreme flatness with minimal thickness variation, achieving one-tenth wave RMS max at 633 nanometers.
- Available in various shapes and finishes, including plano-convex, biconvex, and meniscus, with options for custom coatings and edge bevels.
PROVIDENCE, R.I. – Meller Optics Inc. in Providence, R.I., is introducing a line of optical-grade sapphire wafers for navigation sensors, environmental monitoring, and avionics that must withstand temperature extremes, high aerodynamic loads, and rapid pressure changes in aircraft, uncrewed vehicles, satellites, and re-entry vehicles.
These sapphire wafers are fabricated using a proprietary process for extreme flatness, and come in sizes as large as 200 millimeters O.D. with various thicknesses and plus-or-minus 0.075-millimeter thickness variations, and one-tenth wave RMS max. at 633 nanometers over 47.25-millimeter sub-aperture, both faces.
Surface finishes of these sapphire wafers offer 10-5 scratch-dig with less than 1.0 Arc-Min parallelism can be achieved per MIL-PRF-13830. Featuring plano-convex and -concave, biconvex and -concave, and meniscus, Meller Sapphire Wafers can be planed, wedged, and tapered and have a c-Plane crystallographic orientation.
Edge bevels can be a maximum of 0.6 millimeters face width on both edges. Other optics are available for coaters. For more information contact Meller Optics online at https://melleroptics.com/.
