Officials at Lockheed Martin Information Systems in Huntsville, Ala., needed to upgrade their GETS-1000 test equipment. So they chose the M900 VXI digital test subsystem from Teradyne Inc. in Boston.
"The GETS-1000B1 with Teradyne`s M900 VXI digital test subsystem has proven to be very attractive to our customers who need to perform high-speed digital tests concurrent with microwave and power supply testing," says Robert Gustafson, Patriot Program Manager for GETS at Lockheed Martin.
"The M900 Family has a digital test architecture that`s become a standard within the DOD. Because it is VXI, it has been easy to integrate into GETS, and we expect to take advantage of this in future versions of the GETS system."
The M900s will go into GETS depot test systems that support Patriot and Hawk missiles for foreign military sales and U.S. Army locations.
M900 test electronics deliver 25 MHz to 50 MHz data rates with ±3 to ±10 nanosecond absolute accuracy and full timing flexibility to minimize test development time. As many as 11 channel cards with programmable voltage levels can be configured in a single chassis, each card providing 64 bidirectional test channels with per-pin timing selection. - J.M.
For more information on the M900 and Teradyne, contact Daryl Layzer by phone at 617-422-3808, by fax at 617-422-3440, by mail to Teradyne, Inc., 321 Harrison Avenue, Boston, Mass., 02118, by e-mail at [email protected], or on the World Wide Web at http://www.teradyne.com.
The GETS-1000 by Lockheed Martin Information Systems in Huntsville, Ala., is upgrading with the M900 VXI digital test subsystem from Teradyne Inc. in Boston, Mass.
The Next Generation Signal Processor, being tested on the Canadian frigate Nipigon, uses a Data Transfer ASIC from Applied Microelectronics in Halifax, Nova Scotia.