ABINGDON, England, 8 April 2008. Oxford Instruments in Abingdon, England, is introducing an X-ray fluorescence (XRF) analyzer called the X MET5000 to identify lead, mercury, cadmium, chromium, and other elements regulated by compliance legislation.
The X MET5000 has Oxford's PentaFET detector technology for fast analysis and low detection limits for elements of interest. The X-MET5000 analyzer provides rapid, non-destructive, point-and-shoot compliance screening of plastics, PCBs, cables, plastic housings, solder material, fasteners, sheet metal, and other electronic components.
RoHS regulations restrict the presence of Pb, Hg, Cd, Cr6+ and PBB & PBDE (Br compounds) in electrical and electronic equipment. These regulations influence the manufacturers of electronic goods and supply chains worldwide and require testing of all materials, components and parts used in electronic equipment.
The X-MET5000 conforms to IEC Method 62321 and tests for regulated substances at the compliance levels for all restricted elements.
Industries with high reliability exempt applications like aerospace, medical equipment, and military systems can use X-MET5000 to ensure the presence of adequate lead in product components, especially in finishes and solder joints for product safety and reliability. The X-MET5000 can also sort PVC and Br or Sb containing plastics in seconds and helps to support the Waste Electrical and Electronic Equipment (WEEE) recycling.
User-programmable software delivers results for reliable Go/No-Go decisions. The X-MET5000 will identify material type and automatically chooses the best analysis method. An optional bench-top stand enables hands-free operation for multi-tasking without the loss in confidence in measurement results.
For more information contact Oxford Instruments online at www.oxford-instruments.com.
