Siglent source-measure unit (SMU) for closed-loop power test and measurement offered by Saelig

Summary points:

• The SMM3000X source-measure unit from Siglent Technologies, offered by Saelig Co. Inc., enables simultaneous sourcing and measurement for precise characterization of test devices.
• Delivers 6.5-digit resolution with programming and measurement sensitivity to 10 femtoamps and 100 nanovolts, and supports plus-or-minus 210 volts DC, plus-or-minus 3.03 amps DC, and plus-or-minus 10.5 amps pulsed output.
• Features 100,000 samples per second acquisition, pulse widths to 50 seconds, and supports arbitrary waveform generation for evaluating semiconductors and non-linear components.

FAIRPORT, N.Y. – Electronics distributor Saelig Co. Inc. in Fairport, N.Y. is offering the SMM3000X series source-measure unit (SMU) from Siglent Technologies Inc. in Solon, Ohio, for simultaneous sourcing and measurement for closed-loop operations on test devices.

This device features four-quadrant operation, enabling simultaneous sourcing and measurement, and functions as a power voltage source, current source, voltmeter, ammeter, and ohmmeter.

It also supports pulse generation and arbitrary waveform output for characterizing semiconductors and other non-linear devices and materials.

The SMM3000X test and measurement device feature 6.5-digit resolution, with output capability of as much as plus-or-minus 210 volts DC voltage; plus-or-minus 3.03 amps DC current, and plus-or-minus 10.5 amps pulsed current, with programming and measurement resolution to 10 femtoamps and 100 nanovolts.

100,000 samples per second acquisition

The device offers a maximum acquisition rate of 100,000 samples per second, and features a 5-inch high-resolution capacitive touchscreen, and includes USB and LAN interfaces for PC connectivity and automation.

In pulse mode, the SMM3000X series supports pulsed current output to 10.5 amps, with a minimum pulse width of 50 seconds for precise emulation of transient operating conditions like switching loss testing for gallium nitride (GaN) and silicon carbide (SiC) devices. The SMM3000X also supports linear, log, and pulsed sweep modes for rapid characterization of components such as diodes and transistors.

For more information contact Saelig online at www.saelig.com/supplier/siglent/smm3000x-datasheet-saelig.pdf, or Siglent Technologies at https://siglentna.com/news-article/siglent-launches-smm3000x-series-source-measure-unit/.