Analog Devices MEMS accelerometers enable early detection of structural defects with UAS in harsh environments

NORWOOD, Mass., 5 Oct. 2016. Analog Devices Inc. (ADI) is unveiling three-axis, microelectromechanical system (MEMS) accelerometers that perform high-resolution vibration measurement with very low noise to enable the early detection of structural defects via wireless sensor networks.

The low power consumption of the new ADXL354 and ADXL355 accelerometers lengthens battery life and allows extended product usage by reducing the time between battery changes. The low noise performance of the ADXL354 and ADXL355 with low power consumption cost-effectively enables low-level vibration measurement applications, such as structural health monitoring (SHM).

The ADXL354 and ADXL355 accelerometers offer guaranteed temperature stability with null offset coefficients of 0.15mg/C (max). The stability minimizes resource and expense associated with calibration and testing effort, helping to achieve higher throughput for device OEMs. In addition, the hermetic package helps ensure that the end product conforms to its repeatability and stability specifications long after they leave the factory, company officials say.

With output of ±2g to ±8g full scale range (FSR), selectable digital filtering from 1 Hz to 1 kHz, and low noise density of 25µ/√Hz at less than 200µA current consumption, the ADXL354 and ADXL355 accelerometers offer performance level comparable to much more expensive devices with less power consumption and BOM cost.

Analog Devices (NASDAQ:ADI) designs and manufactures semiconductor products and solutions that enable customers to interpret the world around us by intelligently bridging the physical and digital worlds with unmatched technologies that sense, measure, and connect.

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