CAMBRIDGE, England, 11 March 2008.Curtiss-Wright Controls Embedded Computing in Leesburg, Va., has selected a boundary scan development system from XJTAG in Cambridge, England, to improve the process of debugging and testing its range of radar, video and graphics products.
Curtiss-Wright engineers are using the XJTAG system at the company's video and graphics group in Letchworth, England, to debug and test their latest range of complex printed circuit boards with an increasing number of ball grid array (BGA) devices, including field programmable gate arrays (FPGAs).
"We selected the XJTAG system due to its price, the speed and accuracy of fault diagnosis, and because the re-usable device-centric test scripts can be ported from project to project and migrate through design, prototyping to production and beyond," says Alan McCormick, managing director of Curtiss-Wright's video and graphics group
"Using XJTAG, we can very quickly debug and test both the boundary scan and cluster devices on our boards, many of which are inaccessible to traditional test methods such as flying probes, logic analyzers, oscilloscopes and X-ray systems," McCormick says.
Curtiss-Wright's video and graphics group designs rugged and benign solutions for customers across defense, aerospace, commercial, and industrial applications.
The XJTAG development system is for debugging, testing, and programming electronic printed circuits boards and systems throughout the product lifecycle. It enables engineers to test a high proportion of the circuit (both boundary scan and cluster devices) including BGA and chip scale packages, such as SDRAMs, Ethernet controllers, video interfaces, Flash memories, FPGAs, and microprocessors.
For more information contact XJTAG online at www.xjtag.com, or Curtiss-Wright Controls Embedded Computing at www.cwcembedded.com.
