Another instrument used to measure disk media is the OptiFLAT substrate tester from ADE Phase Shift. Using white light, the tool measures the front-surface flatness of plane-parallel transparent substrates without coating the rear surface. The OptiFLAT features fully interactive data mapping, bearing-surface analysis, and data manipulation; uploading of statistics to networks; single-pass flatness and microwaviness data gathering; high-resolution CCD camera; and video alignment for tip/tilt and distance adjustment.