Radiation-hardened ICs that resist the effects of single-event events (SEE) in space uses offered by Apogee

July 9, 2024
The RelBridge components serve as a crucial bridge between non-radiation-tolerant components in systems and more stringent reliability requirements.

PLANO, Texas – Apogee Semiconductor in Plano, Texas, is introducing the AP54RHC288 arbiter integrated circuit for radiation-hardened space applications to prevent propagation of failure modes in power supply, motor control, and other half-bridge and full-bridge uses.

The AP54RHC288 prevents cross-conduction and shoot-through in these applications by preventing FET drivers from seeing two high-control signals, regardless of the state of the input control signals. The AP54RHC288 resists the effects of single-event effects (SEE) and can be used to improve fault containment in mission critical applications.

The RelBridge components serve as a crucial bridge between non-radiation-tolerant components in systems and more stringent reliability requirements.

Related: Briefings set for new testing procedures in single-event effects (SEE) on radiation-hardened space electronics

The other component in the RelBridge family is the AP54RHC301 voter that enables triple-mode redundancy for mission-critical applications by providing reliable arbitration between redundant channels.

The stand-alone Voter IC that enables more reliable space systems without the need to use several radiation-hardened components for small satellite systems.

The AP54RHC301 is designed to prevent fault propagation between non-radiation tolerant components in systems. For more information contact Apogee Semiconductor online at https://apogeesemi.com.

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