Fast logic analysis system for high-end digital test and measurement introduced by Keysight

SANTA ROSA, Calif., 26 Sept. 2014. Keysight Technologies Inc. in Santa Rosa, Calif., is introducing the U4154B logic analysis test and measurement system for engineers who work on high-end digital designs, mobile, computing, DDR and LPDDR memory and server applications.

Fast logic analysis system for high-end digital test and measurement introduced by Keysight
Fast logic analysis system for high-end digital test and measurement introduced by Keysight
SANTA ROSA, Calif., 26 Sept. 2014. Keysight Technologies Inc. in Santa Rosa, Calif., is introducing the U4154B logic analysis test & measurement system for engineers who work on high-end digital designs, mobile, computing, DDR and LPDDR memory and server applications.

The state-mode logic analyzer from Keysight (formerly Agilent) samples as quickly as 4 gigabits per second, and is for validating simultaneous read and write DDR4 traffic across all byte lanes captured from a DDR4 DIMM operating at data rates of more than 2.5 gigabits per second.

The Keysight U4154B logic analysis system merges three modules to help memory design engineers accelerate turn-on and debugging of DDR2/3/4 and LPDDR2/3/4 memory systems. The system provides data capture, precise triggering and a portfolio of validation and performance tools.

The U4154B combines an state capture speed of 4 gigabits per second with the ability to capture data on small eye openings, as small as 100 ps by 100 mV. These capabilities enable engineers to measure the increasingly fast digital signals used in emerging technologies and validate and troubleshoot their designs.

The instrument is driven by a 64-bit software application that enables users to take full advantage of all memory installed in their 64-bit operating systems.

The Keysight U4154B is an AXIe-based logic analyzer module. Associated probes and powerful analysis software provide essential capabilities for engineers working with DDR and LPDDR memory systems, high-speed application-specific integrated chips, analog-to-digital converters and field-programmable gate arrays operating at speeds to 4 gigabits per second.

Timing zoom provides simultaneous state and timing measurements with 80-ps timing resolution and 256-K-sample memory depth.

For more information contact Keysight online at www.keysight.com.

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