Sandia uses Teradyne test system
Engineers at Sandia National Laboratory`s Microelectronics Development Laboratory in Albuquerque, N.M., needed a test system with analog capabilities for engineering characterization and production testing of integrated microelectromechanical systems (MEMs).
The Catalyst test system from Teradyne in Boston met their needs. Teradyne officials delivered the new superchip test system to Sandia earlier this year.
"We chose the Catalyst because of its 100 MHz Test Head Analog Distribution System, which will minimize the need for custom interfaces," says Anthony Griego, test engineer at Sandia`s microelectronics facility.
"We also are impressed with its proven breadth of analog test capabilities," he says. "We believe these capabilities in conjunction with the Catalyst`s digital speed and pin count will greatly enhance our test environment, which typically services the development of a wide range of small lot, custom and complex devices."
The Catalyst test system features per-pin VLSI digital, embedded memory, and high-performance analog to meet short engineering development cycles and high-volume production test requirements for superchip ICs.
Sandia, operated by Lockheed Martin Corp. for the U.S. Department of Energy, designs and tests the "non-nuclear" parts of nuclear weapons and nuclear weapon stockpile surety and reliability. - J.M.
For more information on Teradyne contact Lynn Stahlberg by phone at 617-422-3176, by fax at 617-422-3440, by mail at Teradyne Inc., 321 Harrison Ave., Boston, Mass. 02118, by e-mail at lynn.Stahlberg@ teradyne.com, or on the World Wide Web at http://www.teradyne.com.
