Electro-optics experts at FLIR Systems introduce four infrared cameras for research applications

March 6, 2017
WILSONVILLE, Ore. – Electro-optics experts at FLIR Systems Inc. in Wilsonville, Ore., is introducing four high-performance infrared cameras for science and research applications.

WILSONVILLE, Ore. –Electro-optics experts at FLIR Systems Inc. in Wilsonville, Ore., is introducing four high-performance infrared cameras for science and research applications.

The FLIR X6800sc, FLIR A8200sc, and FLIR X8500sc midwave infrared (MWIR) cameras and the FLIR A6260sc shortwave infrared camera (SWIR) offer flexibility, fast frame rates, and high sensitivity for demanding scientific research applications.

Each of the infrared cameras blends remote triggering and synchronization, with thermal technology to enable researchers to generate temperature readings in applications ranging from fast-moving objects for aerospace or ballistics testing, to characterizing rapid thermal transients in circuit boards or composite material testing.

The high-speed FLIR X6800sc MWIR camera images at 502 frames per second and saves nearly a minute of data to the on-camera RAM without dropping frames, and can stop motion on high-speed events.

Related: FLIR Systems adds machine vision to infrared know-how with acquisition of Point Grey Research

The FLIR A8200sc produces 1024-by-1024-pixel MWIR thermal images offers sensitivity of less than 20 mK for low noise imaging, and can measure small targets down to 3.5 microns. The camera's image output can be windowed to increase frame rates and accurately characterize high-speed thermal events.

The FLIR X8500sc offers a frame speed of 180 frames per second. The on-camera RAM enables users to record 36 seconds of full-resolution, full frame data with zero dropped frames, then save it the removable FLIR DVIR drive. The X8500sc also streams high speed 14-bit data simultaneously over Gigabit Ethernet, Camera Link, and CoaXpress.

The FLIR A6260sc is a SWIR camera with adjustable frame rate, integration time, and window size for applications such as measuring temperature through glass, laser beam profiling, and silicon wafer inspection applications.

For more information contact FLIR Systems online at www.flir.com/science.

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