Digital I/O instrument for test and measurement applications in harsh environments introduced by Marvin

Sept. 25, 2020
Ruggedized, extended-temperature version is for deploying test and measurement systems in extreme, harsh environments.

IRVINE, Calif. – Marvin Test Solutions Inc. in Irvine, Calif., is introducing the GX3756 series digital I/O instrument for aerospace and defense test and measurement applications.

The field-programmable-gate-array (FPGA)-based GX3756 delivers 56 channels of TTL logic-compatible I/O, segmented into 14 four-channel groups, in a high-performance 3U PXI hybrid slot-compatible instrument.

Users can access each I/O channel using read-and-write register commands and can enable or tri-state each group of four TTL outputs. The GX3756 test and measurement device has the GX3700 FPGA carrier card and an I/O daughter card. Users can modify the FPGA to create their own functions.

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Users can configure four of the 56 TTL outputs to deliver 30-bit, 1 kHz serial data streams, and identify cables connectors with three connector ID bits.

TTL input overvoltage protection ensures safe, reliable operation, and output state monitoring with the readback function helps users verify programmed operation.

"The GX3756 delivers a unique combination of TTL I/O, data streaming and connector/cable identification in a 3U PXI hybrid slot compatible instrument" says Jon Semancik, Director of Marketing for Marvin Test Solutions. "Plus the ruggedized, extended-temperature version is ideal for deploying test systems in extreme, harsh environments."

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The GX3756 series is supplied with GxFPGA software that includes a virtual instrument panel, and a Windows 32/64-bit DLL driver and documentation.

Interface files are provided to support access to programming tools and languages such as ATEasy, LabVIEW, C/C++, Microsoft C#, and Visual Basic .Net. It also comes with a Linux driver with the GtLinux software package.

For more information contact Marvin Test Solutions online at

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